Our Scanning Electron Microscopy (SEM) services deliver critical insights into the surface morphology, particle structure, and texture of a wide range of materials. We specialise in resolving contamination issues, diagnosing component failures, and identifying unknown particulates, supporting industries in their quality control, troubleshooting, and research efforts.
Applications of SEM Analysis
- Failure and Contamination Analysis: Investigating surface defects, wear patterns, and pitting on materials such as metals and polymers.
- Particle Identification: Detecting and identifying unknown particles, contaminants, or fibres.
- Material Research: Understanding the physical and chemical properties of materials, coatings, and composites.
- Surface Interaction Studies: Analysing how materials and substrates interact in complex systems.
Our SEM Expertise
Our team of expert microscopists brings decades of experience across industries, including manufacturing, healthcare, construction, energy, electronics, and consumer goods. We provide high-resolution imaging and perform in-depth analysis using advanced sample preparation techniques, ensuring accurate and meaningful results for your business needs.
Through cross-sectioning techniques, we can also explore the internal structures of materials, providing additional insights into your samples. By working closely with you, we tailor our analysis to meet your specific objectives.
Key SEM Services
- SEM/EDX Analysis (Energy Dispersive X-ray Spectroscopy):
- Combines surface imaging with elemental composition analysis.
- Enables elemental mapping and distribution studies across the sample surface.
- Remote View SEM:
- Real-time interaction with analysts and live instrument control.
- Accelerates decision-making in failure investigations and product development.
- Cryo-SEM (Cryogenic Scanning Electron Microscopy):
- High-pressure freezing techniques for preserving liquid-based samples.
- Ideal for studying formulations like multi-layered vesicles, liposomes, and engineered particulates.
Complementary Techniques
In addition to SEM, we offer complementary microscopy and spectroscopy techniques for a comprehensive analysis:
- Optical Microscopy and Transmission Electron Microscopy (TEM)
- Infra-red (FTIR) Microscopy and Raman Microscopy
- Time-of-Flight Secondary Ion Mass Spectrometry (SIMS) for detailed surface analysis
These techniques are integrated into multi-method approaches to provide a complete understanding of your materials and components.
Why Choose Us?
- Experienced Experts: Many of our SEM scientists have over 20 years of experience in key industries.
- Global Support: Our laboratories in North America and Europe serve global clients with tailored solutions.
- Comprehensive Analysis: From failure analysis to product development, we provide the data and insights you need to drive informed decisions.
Contact us today to learn how our SEM services can help you achieve your research, quality control, and troubleshooting goals.2.
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